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Disambiguation of "Sun, Shupeng"

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Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion.

, , , , , , , , , , , , , and . CICC, page 1-4. IEEE, (2013)

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Yü-Sün Sun

Deming Sun

Hongtao Sun

Haiyan Sun

Hongqing Sun

 

Other publications of authors with the same name

Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space., and . ASP-DAC, page 302-307. IEEE, (2015)Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits., , , and . ICCAD, page 795-802. IEEE, (2013)Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits., , and . CICC, page 1-4. IEEE, (2013)Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells., and . Complex., (2019)Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion., , , , , , , , , and 4 other author(s). CICC, page 1-4. IEEE, (2013)A statistical methodology for noise sensor placement and full-chip voltage map generation., , , , and . DAC, page 94:1-94:6. ACM, (2015)Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space., , , , and . ICCAD, page 478-485. IEEE, (2013)Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data., , , , and . DAC, page 64:1-64:6. ACM, (2013)Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space., and . CICC, page 1-4. IEEE, (2015)Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space., and . ICCAD, page 324-331. IEEE, (2014)