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A Model for VLSI Implementation of CNN Image Processing Chips Using Current-mode Techniques., , , , and . ISCAS, page 970-973. IEEE, (1993)SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems., , , , and . DAC, page 281-286. ACM Press, (1997)Cell-culture measurements using voltage oscillations., , , , , and . LASCAS, page 235-238. IEEE, (2016)A new method for the state reduction of incompletely specified finite sequential machines., , and . EURO-DAC, page 552-556. IEEE Computer Society, (1990)Mixed-Signal SoC Testing: Is Mixed-Signal Design-for-Test on Its Way., , , and . Asian Test Symposium, page 15. IEEE Computer Society, (2000)(Some) Open Problems to Incorporate BIST in Complex Heterogeneous Integrated Systems., , , and . DELTA, page 8-13. IEEE Computer Society, (2010)CMOS Continuous BAM With On Chip Learning., , , and . IWANN, volume 540 of Lecture Notes in Computer Science, page 322-327. Springer, (1991)Statistical behavioral modeling and characterization of A/D converters., , and . ICCAD, page 562-566. IEEE Computer Society / ACM, (1995)Test and design-for-test of mixed-signal integrated circuits.. SBCCI, page 4. ACM, (2004)A BIST Solution for the Functional Characterization of RF Systems Based on Envelope Response Analysis., , , , and . Asian Test Symposium, page 255-260. IEEE Computer Society, (2009)