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Editorial., , и . Microelectron. Reliab., 55 (11): 2173 (2015)InGaP/GaAs heterojunction bipolar transistor and RF power amplifier reliability., , и . Microelectron. Reliab., 48 (8-9): 1212-1215 (2008)Integrated amorphous-Si TFT circuits for gate drivers on LCD panels., , , , , , , , , и 4 other автор(ы). ASICON, стр. 1-4. IEEE, (2013)Digital Volume Pulse Measured at the Fingertip as an Indicator of Diabetic Peripheral Neuropathy in the Aged and Diabetic., , , , , , , и . Entropy, 21 (12): 1229 (2019)Testing the impact of process defects on ECL power-delay performance., , и . VTS, стр. 233-238. IEEE Computer Society, (1991)Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar low-noise amplifier performance., , и . Microelectron. Reliab., 50 (3): 365-369 (2010)Indirect fitting procedure to separate the effects of mobility degradation and source-and-drain resistance in MOSFET parameter extraction., , , , , , и . Microelectron. Reliab., 49 (7): 689-692 (2009)Electrostatic discharge (ESD) protection of RF integrated circuits., , и . APCCAS, стр. 460-462. IEEE, (2012)Statistical sensitivity simulation for integrating design and testing of MOSFET integrated circuits., , , и . VTS, стр. 104-108. IEEE Computer Society, (1991)Compact failure modeling for devices subject to electrostatic discharge stresses - A review pertinent to CMOS reliability simulation., , , , и . Microelectron. Reliab., 55 (1): 15-23 (2015)