Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Memristor based memories: Technology, design and test., , and . DTIS, page 1-7. IEEE, (2014)Efficient Tests for Realistic Faults in Dual-Port SRAMs., and . IEEE Trans. Computers, 51 (5): 460-473 (2002)Computation in Memory for Data-Intensive Applications: Beyond CMOS and beyond Von- Neumann.. SCOPES, page 1. ACM, (2015)Modeling Soft-Error Reliability Under Variability., , , , , and . DFT, page 1-6. IEEE, (2021)Achieving Wave Pipelining in Spin Wave Technology., , , , , and . ISQED, page 54-59. IEEE, (2021)Evaluating the Impact of Process Variation on RRAMs., , , , , , and . LATS, page 1-6. IEEE, (2021)Special Session: STT-MRAMs: Technology, Design and Test., , , , , and . VTS, page 1-10. IEEE, (2022)An automated formal-based approach for reducing undetected faults in ISO 26262 hardware compliant designs., , , and . ITC, page 329-333. IEEE, (2021)Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions., , , , , and . ITC, page 143-152. IEEE, (2021)Magnetic Coupling Based Test Development for Contact and Interconnect Defects in STT-MRAMs., , , , , , , , , and . ITC, page 236-245. IEEE, (2023)