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On dynamic polymorphing of a superscalar core for improving energy efficiency.

, , , , and . ICCD, page 495-498. IEEE Computer Society, (2013)

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Test Challenges in Nanometer Technologies., , , and . J. Electron. Test., 17 (3-4): 209-218 (2001)Remote Device Management via Smart Contracts., and . IEEE Trans. Consumer Electron., 68 (1): 38-46 (2022)Abstraction-Guided Simulation Using Markov Analysis for Functional Verification., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (2): 285-297 (2016)Defeating Strong PUF Modeling Attack via Adverse Selection of Challenge-Response Pairs., , , and . AsianHOST, page 25-30. IEEE, (2018)A study on impact of aggressor de-rating in the context of multiple crosstalk effects in circuits., , and . ACM Great Lakes Symposium on VLSI, page 529-534. ACM, (2009)A Neural Network-Based Approach to Dynamic Core Morphing for AMPs., and . iSES, page 4-9. IEEE, (2023)Dynamic Reconfiguration vs. DVFS: A Comparative Study on Power Efficiency of Processors., , , and . VLSID, page 563-564. IEEE Computer Society, (2016)Shadow checker (SC): A low-cost hardware scheme for online detection of faults in small memory structures of a microprocessor., , and . ITC, page 219-228. IEEE Computer Society, (2010)Test Pattern Generation for Power Supply Droop Faults., , , , , and . VLSI Design, page 343-348. IEEE Computer Society, (2006)Performance sensitivity analysis using statistical method and its applications to delay., , , , and . ASP-DAC, page 587-592. ACM, (2000)