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On the Impact of the Biasing History on the Characterization of Random Telegraph Noise., , , , , , and . IEEE Trans. Instrum. Meas., (2022)A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation., , , , , , and . SMACD, page 1-4. IEEE, (2022)CASE: A reliability simulation tool for analog ICs., , , , , , , and . SMACD, page 1-4. IEEE, (2017)Experimental Characterization of Time-Dependent Variability in Ring Oscillators., , , , , , and . SMACD, page 229-232. IEEE, (2019)Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator., , , , , , , , , and . DATE, page 78-83. IEEE, (2019)A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices., , , , , , , , and . IRPS, page 1-5. IEEE, (2019)New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors., , , , , , , and . DATE, page 150-155. IEEE, (2019)Shape-shifting digital hardware concept: Towards a new adaptive computing system., , , , , and . AHS, page 167-173. IEEE, (2012)Including a stochastic model of aging in a reliability simulation flow., , , , , , , and . SMACD, page 1-4. IEEE, (2017)TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level., , , , , , , and . SMACD, page 197-200. IEEE, (2019)