Author of the publication

Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning.

, , , , and . IEEE Trans. Instrumentation and Measurement, 56 (2): 476-480 (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Surface Layer Analysis of Si Sphere by XRF and XPS., , , , and . IEEE Trans. Instrum. Meas., 64 (6): 1509-1513 (2015)Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry., , , , , and . IEEE Trans. Instrum. Meas., (2022)Mass Measurement of 1-kg Silicon Spheres for Determination of the Avogadro and Planck Constants., , , and . IEEE Trans. Instrumentation and Measurement, 64 (6): 1527-1532 (2015)Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning., , , , and . IEEE Trans. Instrumentation and Measurement, 56 (2): 476-480 (2007)Volume Measurement of a 28Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ., , , , , and . IEEE Trans. Instrum. Meas., 68 (6): 1913-1920 (2019)Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals., , , , and . IEEE Trans. Instrum. Meas., 64 (6): 1692-1695 (2015)Electron Paramagnetic Resonance Study on 28Si Single Crystal for the Future Realization of the Kilogram., , , and . IEEE Trans. Instrumentation and Measurement, 68 (6): 1879-1886 (2019)Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS., , , , and . IEEE Trans. Instrum. Meas., 66 (6): 1297-1303 (2017)Mass Measurement of 28Si-Enriched Spheres at NMIJ for the Determination of the Avogadro Constant., , , and . IEEE Trans. Instrum. Meas., 66 (6): 1275-1282 (2017)Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ., , , , , , , , , and . IEEE Trans. Instrum. Meas., (2021)