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Surface Layer Analysis of Si Sphere by XRF and XPS., , , , и . IEEE Trans. Instrum. Meas., 64 (6): 1509-1513 (2015)Investigating Stability of Si Sphere Surface Layer in Ambient-Vacuum Cyclic Measurements Using Ellipsometry., , , , , и . IEEE Trans. Instrum. Meas., (2022)Mass Measurement of 1-kg Silicon Spheres for Determination of the Avogadro and Planck Constants., , , и . IEEE Trans. Instrumentation and Measurement, 64 (6): 1527-1532 (2015)Density Determination of Silicon Spheres Using an Interferometer With Optical Frequency Tuning., , , , и . IEEE Trans. Instrumentation and Measurement, 56 (2): 476-480 (2007)Homogeneity Characterization of Lattice Spacing of Silicon Single Crystals., , , , и . IEEE Trans. Instrum. Meas., 64 (6): 1692-1695 (2015)Volume Measurement of a 28Si-Enriched Sphere for a Determination of the Avogadro Constant at NMIJ., , , , , и . IEEE Trans. Instrum. Meas., 68 (6): 1913-1920 (2019)Electron Paramagnetic Resonance Study on 28Si Single Crystal for the Future Realization of the Kilogram., , , и . IEEE Trans. Instrumentation and Measurement, 68 (6): 1879-1886 (2019)Thickness Measurement of Oxide and Carbonaceous Layers on a 28Si Sphere by XPS., , , , и . IEEE Trans. Instrum. Meas., 66 (6): 1297-1303 (2017)Mass Measurement of 28Si-Enriched Spheres at NMIJ for the Determination of the Avogadro Constant., , , и . IEEE Trans. Instrum. Meas., 66 (6): 1275-1282 (2017)Reproducibility of the Realization of the Kilogram Based on the Planck Constant by the XRCD Method at NMIJ., , , , , , , , , и . IEEE Trans. Instrum. Meas., (2021)