( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
NBTI and irradiation related degradation mechanisms in power VDMOS transistors.

, , , , , , , , и . Microelectron. Reliab., (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Ninoslav Kratki

Ninoslav Novak

Marija Stojadinovic

Sasa Stojadinovic

 

Другие публикации лиц с тем же именем

NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs., , , , , и . Microelectron. Reliab., 46 (9-11): 1828-1833 (2006)Editorial., и . Microelectron. Reliab., 42 (4-5): 463 (2002)NBTI and irradiation related degradation mechanisms in power VDMOS transistors., , , , , , , , и . Microelectron. Reliab., (2018)Negative bias temperature instability in n-channel power VDMOSFETs., , , , , и . Microelectron. Reliab., 48 (8-9): 1313-1317 (2008)Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs., , , , , и . Microelectron. Reliab., 47 (9-11): 1400-1405 (2007)Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode., , и . Microelectron. Reliab., 48 (8-9): 1193-1197 (2008)NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions., , , , , , , и . Microelectron. Reliab., 51 (9-11): 1540-1543 (2011)Editorial., и . Microelectron. Reliab., 41 (1): 1 (2001)