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NBTI and irradiation related degradation mechanisms in power VDMOS transistors., , , , , , , , and . Microelectron. Reliab., (2018)NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions., , , , , , , and . Microelectron. Reliab., 51 (9-11): 1540-1543 (2011)NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs., , , , , and . Microelectron. Reliab., 46 (9-11): 1828-1833 (2006)A smart data logger system based on sensor and Internet of Things technology as part of the smart faculty., , , , and . J. Ambient Intell. Smart Environ., 12 (4): 359-373 (2020)Negative bias temperature instability in n-channel power VDMOSFETs., , , , , and . Microelectron. Reliab., 48 (8-9): 1313-1317 (2008)Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs., , , , , and . Microelectron. Reliab., 47 (9-11): 1400-1405 (2007)Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System., , , , , , , , , and 8 other author(s). DSD, page 286-293. IEEE, (2023)