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Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.

, , , , , , , and . IEEE Des. Test, 39 (5): 34-42 (2022)

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A high performance SEU-tolerant latch for nanoscale CMOS technology.. DATE, page 1-5. European Design and Automation Association, (2014)Cost-Effective and Highly Reliable Circuit-Components Design for Safety-Critical Applications., , , , , , , , and . IEEE Trans. Aerosp. Electron. Syst., 58 (1): 517-529 (2022)Two sextuple cross-coupled SRAM cells with double-node-upset protection and cost optimization for aerospace applications., , , , , , and . Microelectron. J., (September 2023)A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells., , , , , , , , and . ITC-Asia, page 139-144. IEEE, (2019)Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement., , , , , , , and . IEEE Des. Test, 39 (5): 34-42 (2022)A High-Performance and P-Type FeFET-Based Non-Volatile Latch., , , , and . ATS, page 1-5. IEEE, (2023)Design of Low-Cost Approximate CMOS Full Adders., , , , , , and . ISCAS, page 1-5. IEEE, (2023)A N: 1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICs., , , , , and . ITC-Asia, page 1-5. IEEE, (2021)Lightweight Hybrid Entropy Source True Random Number Generator Based on Jitter and Metastability., , , , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 71 (7): 3513-3517 (July 2024)Design of Wireless Network on Chip with Priority-Based MAC., , , , , and . J. Circuits Syst. Comput., 28 (8): 1950124:1-1950124:18 (2019)