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Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.

T. Ni, J. Bian, Z. Yang, M. Nie, L. Yao, Z. Huang, A. Yan, and X. Wen. IEEE Des. Test, 39 (5): 34-42 (2022)

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Aibin Liang

Yan Yan

Shanshan Yan

Americanization in China: an analysis of General Motors and its strategies in ChinaS. Yan. Uni Mainz, (2009)

Yan Xu

Untersuchungen zur Verleimung von Holz und Holzspanplatten mit UF-Leimharzen und PMDIY. Xu. TU Braunschweig, (2009)

Yan Zhang

Other publications of authors with the same name

Design of a Novel Self-Recoverable SRAM Cell Protected Against Soft Errors.A. Yan, J. Zhou, Y. Hu, Y. Chen, Z. Wu, and T. Ni. DSA, page 497-498. IEEE, (2019)Architecture of Cobweb-Based Redundant TSV for Clustered Faults.T. Ni, D. Liu, Q. Xu, Z. Huang, H. Liang, and A. Yan. IEEE Trans. Very Large Scale Integr. Syst., 28 (7): 1736-1739 (2020)Radiation Hardening by Design of a Novel Double-Node-Upset-Tolerant Latch Combined with Layout Technique.A. Yan, Z. Chen, Z. Huang, X. Fang, M. Yi, and J. Guo. ITC-Asia, page 49-54. IEEE, (2018)Two Highly Reliable and High-Speed SRAM Cells for Safety-Critical Applications.A. Yan, Y. Chang, J. Xiang, H. Luo, J. Cui, Z. Huang, T. Ni, and X. Wen. ACM Great Lakes Symposium on VLSI, page 293-298. ACM, (2023)Novel Low Cost, Double-and-Triple-Node-Upset-Tolerant Latch Designs for Nano-scale CMOS.A. Yan, C. Lai, Y. Zhang, J. Cui, Z. Huang, J. Song, J. Guo, and X. Wen. IEEE Trans. Emerg. Top. Comput., 9 (1): 520-533 (2021)Aging-Temperature-and-Propagation Induced Pulse-Broadening Aware Soft Error Rate Estimation for nano-Scale CMOS.A. Yan, Y. Ling, K. Yang, Z. Chen, and M. Yi. ATS, page 86-91. IEEE, (2018)Novel Application of Deep Learning for Adaptive Testing Based on Long Short-Term Memory.T. Song, H. Liang, Y. Sun, Z. Huang, M. Yi, X. Fang, and A. Yan. VTS, page 1-6. IEEE, (2019)IDLD: Interlocked Dual-Circle Latch Design with Low Cost and Triple-Node-Upset-Recovery for Aerospace Applications.A. Yan, C. Dong, X. Guo, J. Song, J. Cui, T. Ni, P. Girard, and X. Wen. ACM Great Lakes Symposium on VLSI, page 19-24. ACM, (2024)Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications.A. Yan, Z. Wu, L. Lu, Z. Chen, J. Song, Z. Ying, P. Girard, and X. Wen. ATS, page 43-48. IEEE, (2019)A Novel Triple-Node-Upset-Tolerant CMOS Latch Design using Single-Node-Upset-Resilient Cells.Z. Song, A. Yan, J. Cui, Z. Chen, X. Li, X. Wen, C. Lai, Z. Huang, and H. Liang. ITC-Asia, page 139-144. IEEE, (2019)

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Disambiguation of "Yan, Aibin"

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Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.

Please choose a person to relate this publication to

Aibin Liang

Yan Yan

Shanshan Yan

Yan Xu

Yan Zhang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Yan, Aibin"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.

Please choose a person to relate this publication to

Aibin Liang

Yan Yan

Shanshan Yan

Yan Xu

Yan Zhang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Broadcast-TDMA: A Cost-Effective Fault-Tolerance Method for TSV Lifetime Reliability Enhancement.