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Disambiguation of "Gill, Balkaran"

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Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.

, , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)

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Hartmut Gill

Albrecht Gill

Andrej Gill

Stanley Gill

Simone Gill

 

Other publications of authors with the same name

Adaptive Clock Gating for Improving Wear out induced Duty Cycle Shift in the Clock Network., , , and . IRPS, page 1-4. IEEE, (2024)A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes., , , , , , and . IRPS, page 1-4. IEEE, (2023)Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits., , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)Q&R On-Chip (QROC): A Unified, Oven-less and Scalable Circuit Reliability Platform., , , , , , , , , and . IRPS, page 1-6. IEEE, (2022)Node sensitivity analysis for soft errors in CMOS logic., , , and . ITC, page 9. IEEE Computer Society, (2005)Interactive presentation: A new asymmetric SRAM cell to reduce soft errors and leakage power in FPGA., , and . DATE, page 1460-1465. EDA Consortium, San Jose, CA, USA, (2007)Combinational Logic Soft Error Correction., , , , , and . ITC, page 1-9. IEEE Computer Society, (2006)Soft Delay Error Effects in CMOS Combinational Circuits., , and . VTS, page 325-334. IEEE Computer Society, (2004)An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories., , , , and . DATE, page 592-597. IEEE Computer Society, (2005)Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM., , and . IOLTS, page 266-271. IEEE Computer Society, (2005)