( en | de | ru )

 

Disambiguation of "Ramey, Stephen"

Author of the publication

copydeleteadd this publication to your clipboard
Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.

, , , , , , , , , and . IRPS, page 1-5. IEEE, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Stephen Cochrane

Stephen Mamphey

Stephen Lachhein

Stephen Lowry

Stephen Thomas

 

Other publications of authors with the same name

Transistor reliability variation correlation to threshold voltage., , , , , and . IRPS, page 3. IEEE, (2015)A Reliability Overview of Intel's 10+ Logic Technology., , , , , , , , , and 25 other author(s). IRPS, page 1-6. IEEE, (2020)Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG., , , , and . IRPS, page 6. IEEE, (2018)A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies., , , , , , , and . IRPS, page 1-6. IEEE, (2023)Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology., , , and . IRPS, page 1-6. IEEE, (2024)Transistor aging and reliability in 14nm tri-gate technology., , , , , , , , , and . IRPS, page 2. IEEE, (2015)Method to evaluate off-state breakdown in scaled Tri-gate technologies., , , , , and . IRPS, page 1-6. IEEE, (2022)A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes., , , , , , and . IRPS, page 1-4. IEEE, (2023)Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology., , , , , , and . IRPS, page 1-5. IEEE, (2023)Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology., , , , , , , , , and 5 other author(s). IRPS, page 1-5. IEEE, (2020)