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Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs., , , , , and . VLSI-SoC (Selected Papers), volume 508 of IFIP Advances in Information and Communication Technology, page 130-151. Springer, (2016)An Efficient Method for the Test of Embedded Memory Cores during the Operational Phase., , , and . Asian Test Symposium, page 227-232. IEEE Computer Society, (2013)Cumulative embedded memory failure bitmap display & analysis., , , , , , , and . DDECS, page 255-260. IEEE Computer Society, (2010)Diagnosing Faulty Functional Units in Processors by Using Automatically Generated Test Sets., , , , and . MTV, page 37-41. IEEE Computer Society, (2005)