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A built-in scheme for testing and repairing voltage regulators of low-power srams.

, , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2013)

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Aida Nonn

Experimentelle und numerische Analyse des Schädigungsverhaltens von Hybridlaserschweiverbindungen. TU Aachen, (2009)

Patricia Woedem Aidam

Aida Zewdu Kebede

Mu ammad aidar - bkan r

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Effect-cause intra-cell diagnosis at transistor level., , , , , , и . ISQED, стр. 460-467. IEEE, (2013)A study of path delay variations in the presence of uncorrelated power and ground supply noise., , , , , и . DDECS, стр. 189-194. IEEE Computer Society, (2011)A built-in scheme for testing and repairing voltage regulators of low-power srams., , , , , , и . VTS, стр. 1-6. IEEE Computer Society, (2013)Low-power SRAMs power mode control logic: Failure analysis and test solutions., , , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2012)Failure Analysis and Test Solutions for Low-Power SRAMs., , , , , , , и . Asian Test Symposium, стр. 459-460. IEEE Computer Society, (2011)A study of reliability issues in clock distribution networks., и . ICCD, стр. 101-106. IEEE Computer Society, (2008)Analysis and optimization of power-gated ICs with multiple power gating configurations., , и . ICCAD, стр. 783-790. IEEE Computer Society, (2007)Defect analysis in power mode control logic of low-power SRAMs., , , , , , и . ETS, стр. 1. IEEE Computer Society, (2012)Through-Silicon-Via resistive-open defect analysis., , , , , и . ETS, стр. 1. IEEE Computer Society, (2012)Electromigration and voltage drop aware power grid optimization for power gated ICs., , и . ISLPED, стр. 391-394. ACM, (2007)