Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories.

K. Garello, K. Yasin, S. Couet, L. Souriau, J. Swerts, S. Rao, S. Beek, W. Kim, E. Liu, S. Kundu, D. Tsvetanova, K. Croes, N. Jossart, E. Grimaldi, M. Baumgartner, D. Crotti, A. Fumemont, P. Gambardella, and G. Kar. VLSI Circuits, page 81-82. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kris Demuynck

Serge Alex Cyriel Maurice Croes

Kris Verheyen

Kris Lohmann

Adolf Kris

Other publications of authors with the same name

Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps.A. Lesniewska, O. Pedreira, M. Lofrano, G. Murdoch, M. van der Veen, A. Dangol, N. Horiguchi, Z. Tökei, and K. Croes. IRPS, page 1-6. IEEE, (2021)Assessment of critical Co electromigration parameters.O. Pedreira, M. Lofrano, H. Zahedmanesh, P. Roussel, M. van der Veen, V. Simons, E. Chery, I. Ciofi, and K. Croes. IRPS, page 8. IEEE, (2022)TEASE: a systematic analysis framework for early evaluation of FinFET-based advanced technology nodes.A. Mallik, P. Zuber, T. Liu, B. Chava, B. Ballal, P. Bario, R. Baert, K. Croes, J. Ryckaert, M. Badaroglu and 2 other author(s). DAC, page 24:1-24:6. ACM, (2013)BEOL tip-to-tip dielectric reliability characterization using a design-representative test structure.Y. Fang, A. Lesniewska, I. Ciofi, P. Roussel, C. Wu, V. Vega-Gonzalez, I. Wolf, and K. Croes. IRPS, page 1-7. IEEE, (2024)Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill.A. Lesniewska, P. Roussel, D. Tierno, V. Vega-Gonzalez, M. van der Veen, P. Verdonck, N. Jourdan, C. Wilson, Z. Tökei, and K. Croes. IRPS, page 1-6. IEEE, (2020)Insights into metal drift induced failure in MOL and BEOL.C. Wu, O. Pedreira, A. Lesniewska, Y. Li, I. Ciofi, Z. Tökei, and K. Croes. IRPS, page 3. IEEE, (2018)Novel low thermal budget gate stack solutions for BTI reliability in future Logic Device technologies : Invited paper.J. Franco, H. Arimura, J. de Marneffe, A. Vandooren, L. Ragnarsson, Z. Wu, D. Claes, E. Litta, N. Horiguchi, K. Croes and 3 other author(s). ICICDT, page 1-4. IEEE, (2021)Novel Low Thermal Budget CMOS RMG: Performance and Reliability Benchmark Against Conventional High Thermal Budget Gate Stack Solutions.J. Franco, H. Arimura, J. de Marneffe, S. Brus, R. Ritzenthaler, E. Litta, K. Croes, B. Kaczer, and N. Horiguchi. VLSI Technology and Circuits, page 1-2. IEEE, (2023)Statistical aspects of the degradation of LDD nMOSFETs.E. Andries, R. Dreesen, K. Croes, W. Ceuninck, L. Schepper, G. Groeseneken, K. Lo, M. D'Olieslaeger, and J. D'Haen. Microelectron. Reliab., 42 (9-11): 1409-1413 (2002)Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects.C. Wu, A. Chasin, A. Padovani, A. Lesniewska, S. Demuynck, and K. Croes. IRPS, page 1-6. IEEE, (2019)

BibSonomy

Disambiguation of "Croes, Kris"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories.

Please choose a person to relate this publication to

Kris Demuynck

Serge Alex Cyriel Maurice Croes

Kris Verheyen

Kris Lohmann

Adolf Kris

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Croes, Kris"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories.

Please choose a person to relate this publication to

Kris Demuynck

Serge Alex Cyriel Maurice Croes

Kris Verheyen

Kris Lohmann

Adolf Kris

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

SOT-MRAM 300MM Integration for Low Power and Ultrafast Embedded Memories.