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Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors., , , , и . ESSDERC, стр. 234-237. IEEE, (2012)A Complete Logic BIST Technology with No Storage Requirement., и . Asian Test Symposium, стр. 129-134. IEEE Computer Society, (2010)Output-bit selection with X-avoidance using multiple counters for test-response compaction., , , и . ETS, стр. 1-6. IEEE, (2014)Counter-Based Output Selection for Test Response Compaction., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (1): 152-164 (2013)Unveiling of How Image Restoration Contributes to Underwater Object Detection., , , и . ICCE-TW, стр. 1-2. IEEE, (2021)Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment., , , и . ESSDERC, стр. 138-141. IEEE, (2014)Output bit selection methodology for test response compaction., и . ITC, стр. 1-10. IEEE, (2016)A New LFSR Reseeding Scheme via Internal Response Feedback., , , и . Asian Test Symposium, стр. 97-102. IEEE Computer Society, (2013)Traffic Violation Detection via Depth and Gradient Angle Change., , , , и . ICITE, стр. 326-330. IEEE, (2022)Output selection for test response compaction based on multiple counters., , , и . VLSI-DAT, стр. 1-4. IEEE, (2014)