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Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors.

, , , , and . ESSDERC, page 234-237. IEEE, (2012)

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Integrated 4H-silicon carbide diode bridge rectifier for high temperature (773 K) environment., , , and . ESSDERC, page 138-141. IEEE, (2014)Counter-Based Output Selection for Test Response Compaction., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 32 (1): 152-164 (2013)Unveiling of How Image Restoration Contributes to Underwater Object Detection., , , and . ICCE-TW, page 1-2. IEEE, (2021)A New LFSR Reseeding Scheme via Internal Response Feedback., , , and . Asian Test Symposium, page 97-102. IEEE Computer Society, (2013)Output bit selection methodology for test response compaction., and . ITC, page 1-10. IEEE, (2016)Extreme temperature 4H-SiC metal-semiconductor-metal ultraviolet photodetectors., , , , and . ESSDERC, page 234-237. IEEE, (2012)A Complete Logic BIST Technology with No Storage Requirement., and . Asian Test Symposium, page 129-134. IEEE Computer Society, (2010)Output-bit selection with X-avoidance using multiple counters for test-response compaction., , , and . ETS, page 1-6. IEEE, (2014)Traffic Violation Detection via Depth and Gradient Angle Change., , , , and . ICITE, page 326-330. IEEE, (2022)A Test-Per-Clock LFSR Reseeding Algorithm for Concurrent Reduction on Test Sequence Length and Test Data Volume., , and . Asian Test Symposium, page 278-283. IEEE Computer Society, (2012)