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Disambiguation of "Kobayashi, Kazutoshi"

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ST: PERL package for simulation and test environment.

, and . ISCAS (5), page 89-92. IEEE, (2001)

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Kazutoshi Miyazawa

Yoshitake Kobayashi

Wakiko Kobayashi

Wataru Kobayashi

Makoto Kobayashi

 

Other publications of authors with the same name

Temperature Dependence of Bias Temperature Instability (BTI) in Long-term Measurement by BTI-sensitive and -insensitive Ring Oscillators Removing Environmental Fluctuation., , , and . ASICON, page 1-4. IEEE, (2019)Characterizing SRAM and FF soft error rates with measurement and simulation., , , , and . Integr., (2019)Comparison of Radiation Hardness of Stacked Transmission-Gate Flip Flop and Stacked Tristate-Inverter Flip Flop in a 65 nm Thin BOX FDSOI Process., , , and . IOLTS, page 1-6. IEEE, (2019)Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes., , and . IRPS, page 2. IEEE, (2015)A functional memory type parallel processor for vector quantization., , , , and . ASP-DAC, page 665-666. IEEE, (1997)A Yield and Speed Enhancement Technique Using Reconfigurable Devices Against Within-Die Variations on the Nanometer Regime., , , , , , and . FPL, page 1-4. IEEE, (2006)Performance optimization by track swapping on critical paths utilizing random variations for FPGAS., , , and . FPL, page 503-506. IEEE, (2008)Real time low bit-rate video coding algorithm using multi-stage hierarchical vector quantization., , , and . ICASSP, page 2673-2676. IEEE, (1998)Nonvolatile SRAM Using Fishbone-in-Cage Capacitor in a 180 nm Standard CMOS Process for Zero-Standby and Instant-Powerup Embedded Memory on IoT., , and . COOL CHIPS, page 1-3. IEEE, (2021)Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations., and . FPT, page 417-420. IEEE, (2010)