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Fault tolerant application-specific NoC topology synthesis for three-dimensional integrated circuits., , , , , и . SoCC, стр. 296-301. IEEE, (2011)IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults., , , , и . ASP-DAC, стр. 366-371. IEEE, (2006)Oscillation ring based interconnect test scheme for SOC., , , и . ASP-DAC, стр. 184-187. ACM Press, (2005)TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning., , , , , , , и . ITC, стр. 1-6. IEEE, (2019)De Bruijn graph-based communication modeling for fault tolerance in smart grids., , и . APCCAS, стр. 623-626. IEEE, (2012)Test generation for combinational hardware Trojans., , , и . AsianHOST, стр. 1-6. IEEE Computer Society, (2016)Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator., , и . Asian Test Symposium, стр. 91-96. IEEE Computer Society, (2013)IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection., , , и . J. Electron. Test., 23 (4): 341-355 (2007)Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture., , , и . ATS, стр. 95-100. IEEE, (2007)PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques., , , , , , и . ETS, стр. 1-6. IEEE, (2020)