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Test set selection for structural faults in analog IC's.

, , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (7): 1026-1039 (1999)

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Fault simulation for analog test coverage., , , and . ITC, page 1-7. IEEE, (2016)Framework for analog test coverage., , , , and . ISQED, page 468-475. IEEE, (2013)Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics., , and . ITC, page 1-10. IEEE, (2020)Innovative practices on functional testing and fault simulation for FuSa., , , , and . VTS, page 1. IEEE Computer Society, (2018)Innovative practices session 6C DFT for functional safety., and . VTS, page 1. IEEE Computer Society, (2017)Test set selection for structural faults in analog IC's., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (7): 1026-1039 (1999)Innovative practices session 4C: Disruptive solutions in the non-digital world., , , , and . VTS, page 1. IEEE Computer Society, (2014)Scalable and efficient analog parametric fault identification., , , and . ICCAD, page 387-392. IEEE, (2013)Analog and Mixed-Signal Benchmark Circuits-First Release., , , , , , , and . ITC, page 183-190. IEEE Computer Society, (1997)Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs., , and . ITC, page 521-527. IEEE Computer Society, (1996)