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Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits.

, , , and . DAC, page 791-796. ACM, (2006)

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Stochastic variational analysis of large power grids considering intra-die correlations., , , and . DAC, page 211-216. ACM, (2006)Computation of Joint Timing Yield of Sequential Networks Considering Process Variations., , , and . PATMOS, volume 4644 of Lecture Notes in Computer Science, page 125-137. Springer, (2007)Analytical expressions for phase noise eigenfunctions of LC oscillators., , and . ASP-DAC, page 175-180. IEEE Computer Society, (2004)A framework for statistical timing analysis using non-linear delay and slew models., , and . ICCAD, page 225-230. ACM, (2006)Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits., , , and . DAC, page 791-796. ACM, (2006)A Methodology for Characterization of Large Macro Cells and IP Blocks Considering Process Variations., , , and . ISQED, page 200-206. IEEE Computer Society, (2008)Variational Interconnect Delay Metrics for Statistical Timing Analysis., and . ISQED, page 19-24. IEEE Computer Society, (2006)Stochastic Power Grid Analysis Considering Process Variations., , , and . DATE, page 964-969. IEEE Computer Society, (2005)Stochastic analysis of interconnect performance in the presence of process variations., , and . ICCAD, page 880-886. IEEE Computer Society / ACM, (2004)