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SeqL+: Secure Scan-Obfuscation with Theoretical and Empirical Validation., , , , и . IACR Cryptol. ePrint Arch., (2021)Fault Resilience of DNN Accelerators for Compressed Sensor Inputs., , , , и . ISVLSI, стр. 329-332. IEEE, (2022)Bit-by-Bit: Investigating the Vulnerabilities of Binary Neural Networks to Adversarial Bit Flipping., , , , , , и . Trans. Mach. Learn. Res., (2024)DiagNNose: Toward Error Localization in Deep Learning Hardware-Based on VTA-TVM Stack., , , , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (1): 217-229 (января 2024)Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators., , , , и . IEEE Des. Test, 40 (2): 90-99 (апреля 2023)Design and Logic Synthesis of a Scalable, Efficient Quantum Number Theoretic Transform., , , , и . ISLPED, стр. 5:1-5:6. ACM, (2022)HARVEST: Towards Efficient Sparse DNN Accelerators using Programmable Thresholds., , , , и . VLSID, стр. 228-234. IEEE, (2024)Special Session: Effective In-field Testing of Deep Neural Network Hardware Accelerators., , , и . VTS, стр. 1-4. IEEE, (2022)Special Session: Reliability Analysis for AI/ML Hardware., , , , , , и . VTS, стр. 1-10. IEEE, (2021)Detecting Functional Safety Violations in Online AI Accelerators., и . IOLTS, стр. 1-4. IEEE, (2022)