Author of the publication

Semi-Supervised Tumor Response Grade Classification from Histology Images of Colorectal Liver Metastases.

, , , , , , , and . ISBI, page 1-5. IEEE, (2022)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Cell-Level GNN-Based Prediction of Tumor Regression Grade in Colorectal Liver Metastases From Histopathology Images., , , , , , , and . ISBI, page 1-5. IEEE, (2024)Predicting the Response to FOLFOX-Based Chemotherapy Regimen from Untreated Liver Metastases on Baseline CT: a Deep Neural Network Approach., , , , , , , , , and . J. Digit. Imaging, 33 (4): 937-945 (2020)Semi-Supervised Tumor Response Grade Classification from Histology Images of Colorectal Liver Metastases., , , , , , , and . ISBI, page 1-5. IEEE, (2022)Semi-supervised ViT knowledge distillation network with style transfer normalization for colorectal liver metastases survival prediction., , , , , , , , , and . CoRR, (2023)Semi-supervised ViT knowledge distillation network with style transfer normalization for colorectal liver metastases survival prediction., , , , , , , , , and . Medical Image Anal., (2025)A Generic Predictive Model for On-Street Parking Availability., , , , and . INTSYS, volume 310 of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, page 47-60. Springer, (2019)Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs., , , , , , , , and . IRPS, page 6. IEEE, (2018)22FD-SOI Variability Improvement Thanks to SmartCut Thickness Control at Atomic Scale., , , , , , and . ESSDERC, page 64-65. IEEE, (2019)FDSOI: From substrate to devices and circuit applications., , , , and . ESSCIRC, page 45-51. IEEE, (2010)Fluorine Plasma Treatment-Enabled ITO Transistors: Excellent Reliability and Comprehensive Understanding of Temperature Dependence from 77K to 375K., , , , , , , , , and 1 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2024)