( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Evaluation of Low-Voltage SRAM for Error-Resilient Augmented Reality Applications.

, , , и . SiPS, стр. 1-3. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Ky ng Kim

Die Artikelstruktur in passiven zweisprachigen Wörterbüchern Deutsch-Koreanisch: Konzeption zur Erstellung eines zweisprachigen Lernerwörterbuchs Deutsch-Koreanisch. Uni Heidelberg, (2008)

Ryong Kim

Yongkyu Kim

Bongcheol Kim

Kim Gerber

 

Другие публикации лиц с тем же именем

20.6 A 0.5V-VIN 1.44mA-class event-driven digital LDO with a fully integrated 100pF output capacitor., , , и . ISSCC, стр. 346-347. IEEE, (2017)14.7 In-situ techniques for in-field sensing of NBTI degradation in an SRAM register file., , , и . ISSCC, стр. 1-3. IEEE, (2015)Energy-optimal voltage model supporting a wide range of nodal switching rates for early design-space exploration., , и . ICCD, стр. 383-386. IEEE Computer Society, (2015)A Fully Integrated Digital Low-Dropout Regulator Based on Event-Driven Explicit Time-Coding Architecture., и . IEEE J. Solid State Circuits, 52 (11): 3071-3080 (2017)Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper., , , , и . IRPS, стр. 5. IEEE, (2018)Comparative study and optimization of synchronous and asynchronous comparators at near-threshold voltages., , и . ISLPED, стр. 1-6. IEEE, (2017)EMSSIM: emergency medical service simulator with geographic and medical details., , , , , , , , и . WSC, стр. 1272-1284. IEEE/ACM, (2015)Convolutional Neural Network Quantization using Generalized Gamma Distribution., , , , и . CoRR, (2018)CRONuS: Circuit Rapid Optimization with Neural Simulator., , , и . DATE, стр. 1-6. IEEE, (2024)0.5V-VIN, 165-MA/MM2 Fully-Integrated Digital LDO Based on Event-Driven Self-Trisuerina Control., , , , и . VLSI Circuits, стр. 109-110. IEEE, (2018)