( en | de | ru )

 

Disambiguation of "Sakurai, Takayasu"

Author of the publication

copydeleteadd this publication to your clipboard
An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage.

, , , and . IEEE J. Solid State Circuits, 54 (3): 613-622 (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Yoriko Sakurai

Kaneaki Sakurai

Takayasu Shimizu

Miriam Takayasu

 

Other publications of authors with the same name

Reducing IR drop in 3D integration to less than 1/4 using Buck Converter on Top die (BCT) scheme., , , , , , , and . ISQED, page 210-215. IEEE, (2013)Ambient electronics and ultra-low power LSI design.. VLSI-DAT, page 1-31. IEEE, (2012)A 1.8V 30nJ adaptive program-voltage (20V) generator for 3D-integrated NAND flash SSD., , , , , , and . ISSCC, page 238-239. IEEE, (2009)A 2Gb/s 15pJ/b/chip Inductive-Coupling programmable bus for NAND Flash memory stacking., , , , , , , and . ISSCC, page 244-245. IEEE, (2009)High-Speed Circuit Design with Scaled-Down MOSFET's and Low Supply Voltage.. ISCAS, page 1487-1490. IEEE, (1993)A 0.14pJ/b Inductive-Coupling Inter-Chip Data Transceiver with Digitally-Controlled Precise Pulse Shaping., , , and . ISSCC, page 358-608. IEEE, (2007)A High-Speed Inductive-Coupling Link With Burst Transmission., , , , , and . IEEE J. Solid State Circuits, 44 (3): 947-955 (2009)An 11-nW CMOS Temperature-to-Digital Converter Utilizing Sub-Threshold Current at Sub-Thermal Drain Voltage., , , and . IEEE J. Solid State Circuits, 54 (3): 613-622 (2019)Power distribution analysis of VLSI interconnects using model orderreduction., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 21 (6): 739-745 (2002)Statistical leakage current reduction in high-leakage environments using locality of block activation in time domain., , and . IEEE J. Solid State Circuits, 39 (9): 1497-1503 (2004)