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2.5D system integration: a design driven system implementation schema.

, and . ASP-DAC, page 450-455. IEEE Computer Society, (2004)

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Fault Tuples in Diagnosis of Deep-Submicron Circuits., , , , , and . ITC, page 233-241. IEEE Computer Society, (2002)2.5D system integration: a design driven system implementation schema., and . ASP-DAC, page 450-455. IEEE Computer Society, (2004)Prospects for WSI: A Manufacturing Perspective.. Computer, 25 (4): 58-65 (1992)Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells., , and . ITC, page 390-399. IEEE Computer Society, (1984)Improving the Quality of Test Education.. ITC, page 1119. IEEE Computer Society, (1991)Interconnect characteristics of 2.5-D system integration scheme., and . ISPD, page 171-175. ACM, (2001)Current testing.. ITC, page 257. IEEE Computer Society, (1990)To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)Improved Yield Model for Submicron Domain., and . DFT, page 2-10. IEEE Computer Society, (1997)On Test Set Preservation of Retimed Circuits., , , and . DAC, page 176-182. ACM Press, (1995)