( en | de | ru )

 

Disambiguation of "Sharifi, Shamin H."

Author of the publication

copydeleteadd this publication to your clipboard
Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability.

, , , , , , , , , , , and . IMW, page 1-4. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Parviz Sharifi

Sheida Sharifi

Monir Sharifi

Mohammad Sharifi

Ali Sharifi

 

Other publications of authors with the same name

Manufacturable 300mm platform solution for Field-Free Switching SOT-MRAM., , , , , , , , , and 7 other author(s). VLSI Circuits, page 194-. IEEE, (2019)Degradation mechanism of amorphous IGZO-based bipolar metal-semiconductor-metal selectors., , , , , , , , , and 1 other author(s). IRPS, page 10-1. IEEE, (2022)Ultra-low Leakage IGZO-TFTs with Raised Source/Drain for Vt > 0 V and Ion > 30 µA/µm., , , , , , , , , and 14 other author(s). VLSI Technology and Circuits, page 292-293. IEEE, (2022)Device engineering guidelines for performance boost in IGZO front gated TFTs based on defect control., , , , , , , , , and 10 other author(s). ICICDT, page 88. IEEE, (2022)Threshold switching in a-Si and a-Ge based MSM selectors and its implications for device reliability., , , , , , , , , and 2 other author(s). IMW, page 1-4. IEEE, (2021)Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution., , , , , , , , , and 3 other author(s). IRPS, page 1-5. IEEE, (2021)STT-MRAM array performance improvement through optimization of Ion Beam Etch and MTJ for Last-Level Cache application., , , , , , , , , and 6 other author(s). IMW, page 1-4. IEEE, (2021)