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Diagnosis of failing scan cells through orthogonal response compaction.

B. Benware, G. Mrugalski, A. Pogiel, J. Rajski, J. Solecki, и J. Tyszer. European Test Symposium, стр. 221-226. IEEE Computer Society, (2010)

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Weyman Jerzy

Szynka Jerzy

Jerzy Blaszczyk

Jerzy Grybos

Jerzy Cieslik

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Built-In Self-Test for Systems on Silicon.J. Rajski, J. Tyszer, и S. Patel. VLSI Design, стр. 609-610. IEEE Computer Society, (1999)Embedded deterministic test points for compact cell-aware tests.C. Acero, D. Feltham, F. Hapke, E. Moghaddam, N. Mukherjee, V. Neerkundar, M. Patyra, J. Rajski, J. Tyszer, и J. Zawada. ITC, стр. 1-8. IEEE, (2015)DIST: Deterministic In-System Test with X-masking.G. Mrugalski, J. Rajski, J. Tyszer, и B. Wlodarczak. ITC, стр. 20-27. IEEE, (2022)On Using Implied Values in EDT-based Test Compression.M. Gebala, G. Mrugalski, N. Mukherjee, J. Rajski, и J. Tyszer. DAC, стр. 11:1-11:6. ACM, (2014)Hybrid Ring Generators for In-System Test Applications.J. Rajski, M. Trawka, J. Tyszer, и B. Wlodarczak. ETS, стр. 1-6. IEEE, (2023)High Throughput Diagnosis via Compression of Failure Data in Embedded Memory BIST.N. Mukherjee, A. Pogiel, J. Rajski, и J. Tyszer. ITC, стр. 1-10. IEEE Computer Society, (2008)Low power compression of incompatible test cubes.D. Czysz, G. Mrugalski, N. Mukherjee, J. Rajski, P. Szczerbicki, и J. Tyszer. ITC, стр. 704-713. IEEE Computer Society, (2010)On Efficient X-Handling Using a Selective Compaction Scheme to Achieve High Test Response Compaction Ratios.H. Tang, C. Wang, J. Rajski, S. Reddy, J. Tyszer, и I. Pomeranz. VLSI Design, стр. 59-64. IEEE Computer Society, (2005)Two-Dimensional Test Data Decompressor for Multiple Scan Designs.N. Zacharia, J. Rajski, J. Tyszer, и J. Waicukauski. ITC, стр. 186-194. IEEE Computer Society, (1996)Staggered ATPG with capture-per-cycle observation test points.Y. Liu, J. Rajski, S. Reddy, J. Solecki, и J. Tyszer. VTS, стр. 1-6. IEEE Computer Society, (2018)

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