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Disambiguation of "Ding, Yaru"

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Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs.

, , , and . IRPS, page 1-6. IEEE, (2024)

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Ding Ding

Ding Ding

Yaru Nie

Alexander Yarunin

Reinhard Ding

 

Other publications of authors with the same name

Interval time dependent wake-up effect of HfZrO ferroelectric capacitor., , , , , and . IRPS, page 1-4. IEEE, (2023)Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress., , , , and . IRPS, page 50-1. IEEE, (2022)Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs., , , and . IRPS, page 1-6. IEEE, (2024)GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model., , , , and . IRPS, page 1-6. IEEE, (2023)Nanosecond-scale and self-heating free characterization of advanced CMOS transistors utilizing wave reflection., , , and . IRPS, page 1-5. IEEE, (2021)GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States., , , , and . IRPS, page 1-6. IEEE, (2023)Universal Hot Carrier Degradation Model under DC and AC Stresses., , , , and . IRPS, page 7. IEEE, (2022)The Design and Specification of Path Adjustable SFC Using YANG Data Model., , , , and . ISCC, page 1-6. IEEE, (2022)Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^14)$ of HfZrO Anti-ferroelectrics for DRAM Applications., , , , and . IRPS, page 11. IEEE, (2024)Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs., , , and . IRPS, page 1-6. IEEE, (2024)