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Accurate and efficient analytical electrical model of antenna for NFC applications., , , , , , , and . NEWCAS, page 1-4. IEEE, (2013)Which metrics to use for RF indirect test strategy?, , , , , and . SMACD, page 73-76. IEEE, (2019)Estimating Static Parameters of A-to-D Converters from Spectral Analysis., , , , , and . LATW, page 174-179. IEEE, (2002)Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions., , , , , and . ETS, page 1-2. IEEE, (2017)A-to-D converters static error detection from dynamic parameter measurement., , , , and . Microelectron. J., 34 (10): 945-953 (2003)A New Methodology For ADC Test Flow Optimization., , , , and . ITC, page 201-209. IEEE Computer Society, (2003)MIRID: Mixed-Mode IR-Drop Induced Delay Simulator., , , , , and . Asian Test Symposium, page 177-182. IEEE Computer Society, (2013)Electrical Behavior of GOS Fault affected Domino Logic Cell., , , and . DELTA, page 183-189. IEEE Computer Society, (2006)Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies., , , , and . J. Electron. Test., 35 (1): 59-75 (2019)Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations., , , , and . ISVLSI, page 164-169. IEEE Computer Society, (2016)