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Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.

V. Niranjan, D. Neethirajan, C. Xanthopoulos, D. Webster, A. Nahar, and Y. Makris. VTS, page 1-7. IEEE, (2023)

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Thucydides Xanthopoulos

Constantin Xanthopoulos

Constantinos Toulacis

Constantinos Neophytou

Constantinos Phanouriou

Other publications of authors with the same name

Harnessing process variations for optimizing wafer-level probe-test flow.A. Ahmadi, C. Xanthopoulos, A. Nahar, B. Orr, M. Pas, and Y. Makris. ITC, page 1-8. IEEE, (2016)On Improving Hotspot Detection Through Synthetic Pattern-Based Database Enhancement.G. Reddy, C. Xanthopoulos, and Y. Makris. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 40 (12): 2522-2527 (2021)Subtle Anomaly Detection of Microscopic Probes using Deep learning based Image Completion.K. Ikeda, K. Schaub, I. Leventhal, Y. Makris, C. Xanthopoulos, and D. Neethirajan. ITC, page 1-3. IEEE, (2019)Automated Die Inking through On-line Machine Learning.C. Xanthopoulos, A. Neckermann, P. List, K. Tschernay, P. Sarson, and Y. Makris. IOLTS, page 27-32. IEEE, (2019)Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.V. Niranjan, D. Neethirajan, C. Xanthopoulos, D. Webster, A. Nahar, and Y. Makris. VTS, page 1-7. IEEE, (2023)Automated Socket Anomaly Detection through Deep Learning.N. Agrawal, M. Yang, C. Xanthopoulos, V. Thangamariappan, J. Xiao, C. Ho, K. Schaub, and I. Leventhal. ITC, page 1-5. IEEE, (2020)Machine Learning-based Noise Classification and Decomposition in RF Transceivers.D. Neethirajan, C. Xanthopoulos, K. Subramani, K. Schaub, I. Leventhal, and Y. Makris. VTS, page 1-6. IEEE, (2019)Enhanced hotspot detection through synthetic pattern generation and design of experiments.G. Reddy, C. Xanthopoulos, and Y. Makris. VTS, page 1-6. IEEE Computer Society, (2018)Zero Trust Approach to IC Manufacturing and Testing.B. Buras, C. Xanthopoulos, K. Butler, and J. Kim. ITC, page 583-586. IEEE, (2022)Trim Time Reduction in Analog/RF ICs Based on Inter-Trim Correlation.V. Niranjan, D. Neethirajan, C. Xanthopoulos, E. Rosa, C. Alleyne, S. Mier, and Y. Makris. VTS, page 1-7. IEEE, (2021)

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Disambiguation of "Xanthopoulos, Constantinos"

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Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.

Please choose a person to relate this publication to

Thucydides Xanthopoulos

Constantin Xanthopoulos

Constantinos Toulacis

Constantinos Neophytou

Constantinos Phanouriou

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Xanthopoulos, Constantinos"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.

Please choose a person to relate this publication to

Thucydides Xanthopoulos

Constantin Xanthopoulos

Constantinos Toulacis

Constantinos Neophytou

Constantinos Phanouriou

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Machine Learning-Based Adaptive Outlier Detection for Underkill Reduction in Analog/RF IC Testing.