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High-reliability fault tolerant digital systems in nanometric technologies: Characterization and design methodologies.

, , , , , , , , , , , , , , и . DFT, стр. 121-125. IEEE Computer Society, (2012)

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Omana Trentz

Martin Klug

The late Quaternary environmental and climatic history of North-East Greenland, inferred from coastal lakes. Uni Köln, (2009)

Martin Brückner

Vergleichende Untersuchungen zur Inzidenz apoptotischer und proliferativer Veränderungen kultivierter, humaner Knochenzellen von Ober- und Unterkiefer auf maschinenbearbeitetem, reinem Titan über 25 Tage. Uni Leipzig, (2009)

Martin Breitenfeldt

Mass measurements on short-lived Cd and Ag nuclides at the online mass spectrometer ISOLTRAP. Uni Greifswald, (2009)

Martin Faes

Analyse der mehrskaligen Transportmechanismen beim laminaren Mischen mittels laseroptischer und numerischer Methoden. Uni Hannover, (2009)
 

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Novel compensation scheme for local clocks of high performance microprocessors., , , и . ITC, стр. 1-9. IEEE Computer Society, (2007)Novel low-cost aging sensor., , , и . Conf. Computing Frontiers, стр. 93-94. ACM, (2010)Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST., , , , , и . IEEE Trans. Computers, 65 (8): 2484-2494 (2016)Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection., , и . LATS, стр. 1-6. IEEE, (2022)Multiple Transient Faults in Logic: An Issue for Next Generation ICs., , , и . DFT, стр. 352-360. IEEE Computer Society, (2005)Low Cost Concurrent Error Detection Strategy for the Control Logic of High Performance Microprocessors and Its Application to the Instruction Decoder., , , , , и . J. Electron. Test., 29 (3): 401-413 (2013)Accurate Linear Model for SET Critical Charge Estimation., , , , и . IEEE Trans. Very Large Scale Integr. Syst., 17 (8): 1161-1166 (2009)Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST., , , , , и . IEEE Trans. Very Large Scale Integr. Syst., 25 (1): 238-246 (2017)Advanced techniques for concurrent fault detection.. University of Bologna, Italy, (2005)Path (Min) Delay Faults and Their Impact on Self-Checking Circuits' Operation., , , , и . IOLTS, стр. 17-22. IEEE Computer Society, (2006)