( en | de | ru )

 

Disambiguation of "Han, Yinhe"

Author of the publication

copydeleteadd this publication to your clipboard
Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code.

, , , and . ASP-DAC, page 53-58. ACM Press, (2005)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Bing Han

Johannes Han

Luyang Han

Mei Han

Muxin Han

 

Other publications of authors with the same name

Test-Quality Optimization for Variable $n$ -Detections of Transition Faults., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (8): 1738-1749 (2014)Statistical lifetime reliability optimization considering joint effect of process variation and aging., , , and . Integr., 44 (3): 185-191 (2011)A Cost-Effective Energy Optimization Framework of Multicore SoCs Based on Dynamically Reconfigurable Voltage-Frequency Islands., , , and . ACM Trans. Design Autom. Electr. Syst., 21 (2): 27:1-27:14 (2016)Mathematical Framework for Optimizing Crossbar Allocation for ReRAM-based CNN Accelerators., , and . ACM Trans. Design Autom. Electr. Syst., 29 (1): 21:1-21:24 (January 2024)Energy-Efficient In-SRAM Accumulation for CMOS-based CNN Accelerators., , and . ACM Great Lakes Symposium on VLSI, page 293-298. ACM, (2022)F3D: Accelerating 3D Convolutional Neural Networks in Frequency Space Using ReRAM., , , , , and . DAC, page 571-576. IEEE, (2021)DeepBurning-SEG: Generating DNN Accelerators of Segment-Grained Pipeline Architecture., , , , and . MICRO, page 1396-1413. IEEE, (2022)Two-Stage Safe Reinforcement Learning for High-Speed Autonomous Racing., , , , and . SMC, page 3934-3941. IEEE, (2020)Test data compression based on clustered random access scan., , , , , , , , and . ATS, page 231-236. IEEE, (2006)Hardware-Software Co-Design for Content-Based Sparse Attention., , , , , and . ICCD, page 415-418. IEEE, (2023)