Author of the publication

OPC-Friendly De-Compaction with Timing Constraints for Standard Cell Layouts.

, , and . ISQED, page 776-781. IEEE Computer Society, (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A 0.0053-mm2 6-bit Fully-Standard-Cell-Based Synthesizable SAR ADC in 65 nm CMOS., , and . NEWCAS, page 1-4. IEEE, (2019)A high frequency resolution Digitally-Controlled Oscillator using single-period switching scheme., , and . ESSCIRC, page 399-402. IEEE, (2011)Digitally-Controlled Compensation Current Injection to ATE Power Supply for Emulation of Customer Environment., , , , , , and . J. Electron. Test., 34 (2): 147-161 (2018)A calibration-free time difference accumulator using two pulses propagating on a single buffer ring., , , and . A-SSCC, page 1-4. IEEE, (2015)High-Precision Sub-Nyquist Sampling System Based on Modulated Wideband Converter for Communication Device Testing., , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (1): 378-388 (2022)INVITED PAPER: A 4.5-5.4GHz Digital Bang-Bang PLL for Cryogenic Applications., , , , , , , , and . ICTA, page 1-4. IEEE, (2023)140 GHz Energy-Efficient OOK Receiver using Self-Mixer-Based Power Detector in 65nm CMOS., , and . ICICDT, page 73-76. IEEE, (2022)A 10-GHz Inductorless Cascaded PLL with Zero-ISF Subsampling Phase Detector Achieving -63-dBc Reference Spur, 175-fs RMS Jitter and -240-dB FOMjitter., , , and . VLSI Technology and Circuits, page 10-11. IEEE, (2022)Automatic Visualization Method for Visual Data Mining., , , and . PAKDD, volume 1394 of Lecture Notes in Computer Science, page 173-185. Springer, (1998)An ultra-wide-range fine-resolution two-step time-to-digital converter with built-in foreground coarse gain calibration., , , and . ICECS, page 231-234. IEEE, (2017)