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Другие публикации лиц с тем же именем

Verification and Analysis of Self-Checking Properties through ATPG., и . IOLTS, стр. 25-30. IEEE Computer Society, (2008)The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems., и . DFT, стр. 101-108. IEEE Computer Society, (2010)Are Robust Circuits Really Robust?, и . DFT, стр. 77-77. IEEE Computer Society, (2009)