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The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.

, and . DFT, page 101-108. IEEE Computer Society, (2010)

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Other publications of authors with the same name

Verification and Analysis of Self-Checking Properties through ATPG., and . IOLTS, page 25-30. IEEE Computer Society, (2008)Are Robust Circuits Really Robust?, and . DFT, page 77-77. IEEE Computer Society, (2009)The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems., and . DFT, page 101-108. IEEE Computer Society, (2010)