( en | de | ru )

 

Disambiguation of "Chaudhuri, Arjun"

Author of the publication

copydeleteadd this publication to your clipboard
Fault-Criticality Assessment for AI Accelerators using Graph Convolutional Networks.

, , , , and . DATE, page 1596-1599. IEEE, (2021)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Selvam Arjunan

Arjun Roy

Arjun Chandra

Arjun Suresh

Arjun Chennu

 

Other publications of authors with the same name

Advances in Testing and Design-for-Test Solutions for M3D Integrated Circuits., , , and . DATE, page 152-157. IEEE, (2021)Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin∗., , , , , and . ITC, page 73-82. IEEE, (2021)Functional Criticality Classification of Structural Faults in AI Accelerators., , , and . ITC, page 1-5. IEEE, (2020)Innovation Practices Track: Testability and Dependability of AI Hardware and Autonomous Systems., , , and . VTS, page 1. IEEE, (2023)Machine Learning for Testing Machine-Learning Hardware: A Virtuous Cycle., , and . ICCAD, page 160:1-160:6. ACM, (2022)Structural Test Generation for AI Accelerators using Neural Twins., , and . IOLTS, page 1-6. IEEE, (2022)Single Chip Self-Tunable N-Input N-Output PID Control System with Integrated Analog Front-end for Miniature Robotics., , and . CoRR, (2016)RTL-to-GDS Design Tools for Monolithic 3D ICs., , , , , , , , , and . ICCAD, page 126:1-126:8. IEEE, (2020)Functional Test Generation for AI Accelerators using Bayesian Optimization∗., , , and . VTS, page 1-6. IEEE, (2023)Special Session: Fault Criticality Assessment in AI Accelerators., , and . VTS, page 1-4. IEEE, (2022)