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Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes.

, , , , , , , , , and . DDECS, page 376-381. IEEE Computer Society, (2010)

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Is test power reduction through X-filling good enough?, , , , , , , , , and . ITC, page 805. IEEE Computer Society, (2010)A Novel Testing Approach for Safety-Critical Software., and . Asian Test Symposium, page 251-255. IEEE Computer Society, (1999)How to Design an Environment Simulator for Safety Critical Software Testing., and . Asian Test Symposium, page 256-. IEEE Computer Society, (1999)Rough-Hierarchical Testing for Safety Critical Software., , and . Asian Test Symposium, page 126-130. IEEE Computer Society, (1998)Effective Launch-to-Capture Power Reduction for LOS Scheme with Adjacent-Probability-Based X-Filling., , , , , , , , , and 1 other author(s). Asian Test Symposium, page 90-95. IEEE Computer Society, (2011)Efficiency Analysis and Safety Assessment of Automatic Testing for Safety-Critical Software., and . Asian Test Symposium, page 106-109. IEEE Computer Society, (2003)Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes., , , , , , , , , and . DDECS, page 376-381. IEEE Computer Society, (2010)A Software Acceptance Testing Technique Based on Knowledge Accumulation., and . Great Lakes Symposium on VLSI, page 296-299. IEEE Computer Society, (1999)