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Fundamental reliability issues of advanced charge-trapping Flash memory devices.

, and . ICECS, page 1009-1012. IEEE, (2010)

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A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design., , , and . ESSDERC, page 204-207. IEEE, (2017)Towards a Universal Model of Dielectric Breakdown., , , , , and . IRPS, page 1-8. IEEE, (2023)Wireless sensor systems with energy harvesting capabilities for safety enhancement in agricultural vehicles., and . ICIT, page 1950-1955. IEEE, (2016)Active safety system with RF energy harvesting capabilities for industrial applications using interchangeable implements., , , , and . IECON, page 5286-5292. IEEE, (2014)Fundamental reliability issues of advanced charge-trapping Flash memory devices., and . ICECS, page 1009-1012. IEEE, (2010)Characterization and Multiscale Modeling of TDDB in State-of-the-art BEOL., , , , , , , , , and 15 other author(s). IRPS, page 10. IEEE, (2024)Enhancing safety in vehicles with implement or trailer using an autonomous wireless sensor network system., , , , and . ICVES, page 234-240. IEEE, (2012)An inductor-less 13.5-Gbps 8-mW analog equalizer for multi-channel multi-frequency operation., , , and . ISCAS, page 189-192. IEEE, (2011)Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS., , , and . ESSDERC, page 166-169. IEEE, (2013)A microscopic physical description of RTN current fluctuations in HfOx RRAM., , , , , and . IRPS, page 5. IEEE, (2015)