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Optical losses in single-mode laser diodes., , , and . Microelectron. Reliab., 53 (9-11): 1529-1533 (2013)An automated lifetest equipment for optical emitters., , , , and . Microelectron. Reliab., 42 (9-11): 1311-1315 (2002)Backside Failure Analysis of GaAs ICs after ESD tests., , , , and . Microelectron. Reliab., 42 (9-11): 1293-1298 (2002)ESD tests on 850 nm GaAs-based VCSELs., , , and . Microelectron. Reliab., (2016)ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology., , , , , , , and . Microelectron. Reliab., 42 (9-11): 1303-1306 (2002)Chip and package-related degradation of high power white LEDs., , , , , , and . Microelectron. Reliab., 52 (5): 804-812 (2012)Clamp voltage and ideality factor in laser diodes., , , and . Microelectron. Reliab., 55 (9-10): 1736-1740 (2015)Stress-induced instabilities of shunt paths in high efficiency MWT solar cells., , , , , , , , , and . IRPS, page 3. IEEE, (2015)Uso de las unidades fraseológicas en un corpus de género periodístico (español - italiano), and . (2011)