( en | de | ru )

 

Disambiguation of "Nag, Pranab K."

Author of the publication

copydeleteadd this publication to your clipboard
Testing oriented analysis of CMOS ICs with opens.

, , and . ICCAD, page 344-347. IEEE Computer Society, (1988)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Pranab Kumar Banerjee

Pranab Kumar Datta

Pranab Kumar Sarma

Suhrit Kumar Nag

Devinder Singh Nag

 

Other publications of authors with the same name

To DFT or Not to DFT?, , , , and . ITC, page 557-566. IEEE Computer Society, (1997)CAD at the Design-Manufacturing Interface., , , , , and . DAC, page 321-326. ACM Press, (1997)Testability-oriented channel routing., , , , and . VLSI Design, page 208-213. IEEE Computer Society, (1995)Design-Manufacturing Interface: Part II - Applications., , , , , and . DATE, page 557-562. IEEE Computer Society, (1998)Hierarchical extraction of critical area for shorts in very large ICs., and . DFT, page 19-27. IEEE Computer Society, (1995)Design for manufacturability in submicron domain., , , and . ICCAD, page 690-697. IEEE Computer Society / ACM, (1996)Testing oriented analysis of CMOS ICs with opens., , and . ICCAD, page 344-347. IEEE Computer Society, (1988)DREAMS: DFM rule EvAluation using manufactured silicon., , , , , and . ICCAD, page 99-106. IEEE, (2013)AFFCCA: a tool for critical area analysis with circular defects and lithography deformed layout., , , , , , and . DFT, page 10-18. IEEE Computer Society, (1995)Design-Manufacturing Interface: Part I - Vision., , , and . DATE, page 550-556. IEEE Computer Society, (1998)