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Fault isolation in a case study of failure analysis on Metal-Insulator-Metal capacitor structures., , , , , and . Microelectron. Reliab., 55 (9-10): 1640-1643 (2015)Case study of failure analysis in thin film silicon solar cell., , , , and . Microelectron. Reliab., 55 (9-10): 1800-1803 (2015)Case study: Failure analysis for metal corrosion induced by pressure pot test., , , and . Microelectron. Reliab., 50 (9-11): 1436-1440 (2010)Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface., , , , , , , , and . Microelectron. Reliab., 55 (9-10): 1617-1621 (2015)Sample Preparation methodology for ultra thin oxide damage in Metal-Insulator-Metal capacitors., , , and . Microelectron. Reliab., 52 (9-10): 2064-2067 (2012)Study of nanocrystal memory integration in a Flash-like NOR device., , , , , , , and . Microelectron. Reliab., 47 (4-5): 593-597 (2007)Silicon photomultipliers with embedded optical filters for wearable healthcare applications., , , , , , , , and . IEEE SENSORS, page 1-3. IEEE, (2017)