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Towards a nanofabricated vacuum cold-emitting triode., , , and . SMACD, page 1-4. IEEE, (2017)Measurement of the hot carrier damage profile in LDMOS devices stressed at high drain voltage., , , , , , , and . Microelectron. Reliab., 47 (4-5): 806-809 (2007)Radiation effects in nitride read-only memories., , , , , , , , , and 3 other author(s). Microelectron. Reliab., 50 (9-11): 1857-1860 (2010)Guest Editorial.. Microelectron. Reliab., 47 (4-5): 477-478 (2007)CY5 fluorescence measured with silicon photomultipliers., , , , , , , , , and . BioCAS, page 284-287. IEEE, (2014)Flexible CW-fNIRS system based on Silicon Photomultipliers: In-vivo characterization of sensorimotor response., , , , , , , and . IEEE SENSORS, page 1-3. IEEE, (2017)Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories., , , and . IEEE Trans. Instrum. Meas., 57 (2): 364-368 (2008)Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks., , and . Microelectron. Reliab., (2016)Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures., , and . IDT/IIMSS/STET, volume 262 of Frontiers in Artificial Intelligence and Applications, page 758-767. IOS Press, (2014)A novel approach to characterization of progressive breakdown in high-k/metal gate stacks., , , , , , , , and . Microelectron. Reliab., 48 (11-12): 1759-1764 (2008)