( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

, , , , , , , , , , , , , , , и . ICICDT, стр. 1-4. IEEE, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Alejandro Luque Estepa

Maria José Arrabali Luque-Mäder

Petra Marialke-Kandaouroff

Manuel Mariadasa

Boris Mariacher

 

Другие публикации лиц с тем же именем

Reliability impact of advanced doping techniques for DRAM peripheral MOSFETs., , , , , , , и . ICICDT, стр. 1-4. IEEE, (2015)Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations., , , , , , , , и . Microelectron. Reliab., 54 (9-10): 2258-2261 (2014)Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications., , , , , , , , , и 6 other автор(ы). ICICDT, стр. 1-4. IEEE, (2012)Comparison of NBTI aging on adder architectures and ring oscillators in the downscaling technology nodes., , , , , , , , , и 5 other автор(ы). Microprocess. Microsystems, 39 (8): 1039-1051 (2015)Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area., , , , , , , и . IRPS, стр. 1-6. IEEE, (2021)Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs., , , , , , , , , и 1 other автор(ы). IRPS, стр. 1-6. IEEE, (2019)Self-heating characterization and its applications in technology development., , , , , , , , , и 8 other автор(ы). NATW, стр. 1-7. IEEE, (2020)