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Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications.

, , , , , , , , , , , , , , , и . ICICDT, стр. 1-4. IEEE, (2012)

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Jacopo Grazzini

Jacopo Janner

Jacopo Negroni

Jacopo Mauro

Jacopo Ghiglieri

 

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