Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Statistical identification and analysis of defect development in digital imagers., , , and . Digital Photography, volume 7250 of SPIE Proceedings, page 72500. SPIE, (2009)Fault Tolerance for Islandable-Microgrid Sensors., and . DFT, page 1-4. IEEE, (2021)Hot Pixel Behavior as Pixel Size Reduces to 1 micron., , , and . IMSE, page 39-45. Society for Imaging Science and Technology, (2017)Correcting high-density hot pixel defects in digital imagers., , , and . IMSE, volume 9022 of SPIE Proceedings, page 90220G. SPIE, (2014)Empirical formula for rates of hot pixel defects based on pixel size, sensor area, and ISO., , , and . Sensors, Cameras, and Systems for Industrial and Scientific Applications, volume 8659 of SPIE Proceedings, page 86590C. SPIE, (2013)Advanced Fault-Tolerance Techniques for a Color Digital Camera-on-a-Chip., , and . DFT, page 3-10. IEEE Computer Society, (2001)Experimental study and analysis of soft and permanent errors in digital cameras., , , , and . DFT, page 11-14. IEEE Computer Society, (2016)Laser Correcting Defects to Create Transparent Routing for Large Area FPGA's., and . FPGA, page 17-23. ACM, (1997)Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation., , , , , and . DFT, page 1-4. IEEE, (2020)Image Degradation due to Interacting Adjacent Hot Pixels., , , and . DFT, page 1-6. IEEE, (2022)