( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology.

, , , , , , , и . IRPS, стр. 1. IEEE, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Balaji Samikannu

Hari Balaji

Narasimham Mulakaluri

Balaji Birajdar

Balaji Palanisamy

 

Другие публикации лиц с тем же именем

Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET., , , , , и . IRPS, стр. 1-5. IEEE, (2021)Soft Error Performance of High-Speed Pulsed-DICE-Latch Design in 16 nm and 7 nm FinFET Processes., , , и . IRPS, стр. 1-4. IEEE, (2019)Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies., , , , , , и . IRPS, стр. 1-5. IEEE, (2019)Designing soft-error-aware circuits with power and speed optimization., , , , и . IRPS, стр. 5-1. IEEE, (2018)Soft Error Characterization of D-FFs at the 5-nm Bulk FinFET Technology for the Terrestrial Environment., , , , , , , , , и 1 other автор(ы). IRPS, стр. 7. IEEE, (2022)Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology., , , , , , и . IRPS, стр. 1-5. IEEE, (2020)Evaluation of the system-level SER performance of gigabit ethernet transceiver devices., , , и . IRPS, стр. 4. IEEE, (2018)Terrestrial SER characterization for nanoscale technologies: A comparative study., , , , , , , , , и 5 other автор(ы). IRPS, стр. 4. IEEE, (2015)Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs., , , , , , и . IRPS, стр. 1-4. IEEE, (2023)Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology., , , , , и . IRPS, стр. 1-5. IEEE, (2021)