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Disambiguation of "Prakash, Om"

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Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.

, , , , , and . IRPS, page 5-1. IEEE, (2022)

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Om Prakash Kulshreshtha

Om Prakash Lal

Om Prakash Kashyap

Om Prakash Garg

Om Prakash Luther

 

Other publications of authors with the same name

Cyclic codes over $M_4 (F_2+uF_2)$., , and . Cryptogr. Commun., 14 (5): 1021-1034 (2022)Quantum codes from the cyclic codes over $$F_pu,v,w/u^2-1,v^2-1,w^2-1,uv-vu,vw-wv,wu-uw$$ F p u , v , w / ⟨ u 2 - 1 , v 2 - 1 , w 2 - 1 , u v - v u , v w - w v , w u - u w ⟩., and . J. Appl. Math. Comput., 60 (1-2): 625-635 (June 2019)A note on skew constacyclic codes over 픽q + u픽q + v픽q., and . Discret. Math. Algorithms Appl., 11 (3): 1950030:1-1950030:13 (2019)Cumulative residual Kullback-Leibler divergence based sensor placement using reliability criteria., and . Comput. Chem. Eng., (2022)On ZpZpu, v-additive cyclic and constacyclic codes., and . CoRR, (2019)Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness., , and . IRPS, page 1-4. IEEE, (2023)Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning., , , , , , and . ISCAS, page 1-5. IEEE, (2023)Rule based human activity recognition for surveillance system., , , and . IHCI, page 1-6. IEEE, (2012)Reliability Challenges with Self-Heating and Aging in FinFET Technology., , , , , , and . IOLTS, page 68-71. IEEE, (2019)A unified Verilog-A compact model for lateral Si nanowire (NW) FET incorporating parasitics for circuit simulation., , , , , and . VDAT, page 1-6. IEEE, (2016)